- Industry: Semiconductors
- Number of terms: 2987
- Number of blossaries: 0
- Company Profile:
National Semiconductor Corporation designs, develops, manufactures, and markets analog and mixed-signal integrated circuits and sub-systems.
The recording, by individual device serial number, of the actual parametric values measured for that device at a specific electrical test point. Read-and-record can be done for device characterization, drift (delta) measurement, or temperature coefficient computation.
Industry:Semiconductors
The placement of a new bond on the same pad or post as a previously attempted bond. If the original bond has been removed, the new bond is still considered a rebond. A bond-off, that is, an extra bond placed at the edge of the post (never the pad) for the purpose of clearing the bonding machine, is not considered a rebond.
Industry:Semiconductors
For a sample test, the number of failed devices which will cause lot rejection. This will normally be one higher than the accept number.
Industry:Semiconductors
The anticipated lifetime of a device, how long it can be expected to "survive" in the user's system. This is normally defined as a failure rate (percent per 1000 hours) or as an MTBF (Mean Time Between Failures, expressed in hours).
Industry:Semiconductors
A test which requires immersion of sample devices in such solvents as trichlorotrifluoroethane and methylene chloride, followed by brushing to determine the durability of unit marking.
Industry:Semiconductors
A one page document used by National Semiconductor to detail the actual electrical testing for a given military device type.
Industry:Semiconductors
A semiconductor device for storing data in permanent, nonerasable form, usually accomplished through the configuration of the metal mask pattern during wafer fabrication.
Industry:Semiconductors
Exposure of sample devices to a salt rich environment to determine long-term durability of the package materials.
Industry:Semiconductors
A device or devices randomly chosen from a lot of material. Sampling assumes that randomly selected devices will exhibit characteristics during testing that are typical of the lot as a whole.
Industry:Semiconductors
A statistically derived set of sample sizes, accept numbers, and/or reject numbers which will confirm that a given lot of materials meets established AQLs or LTPDs.
Industry:Semiconductors
